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Lecturer(s)
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Haviar Stanislav, RNDr. Ph.D.
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Course content
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Classification of analytical techniques, spectroscopy (optical emission, X-ray, fluorescent, atomic absorption, electron, vibrational, mass, nuclear magnetic resonance, Mössbauer), thermal analysis (differential, thermogravimetry, pyrolysis, thermoevolutional techniques, chromatography), diffraction (X-ray, electron), microscopy (metallurgical, polarization, scanning electron, transmission electron, scanning tunnelling, acoustics), image analysis, microanalysis (electron, ion, Raman, reflection spectral, microphotometry, Kossel diffraction), tomography (radiation, acoustic, nuclear magnetic resonance).
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Learning activities and teaching methods
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Lecture, Practicum
- Contact hours
- 65 hours per semester
- Preparation for an examination (30-60)
- 60 hours per semester
- Preparation for comprehensive test (10-40)
- 20 hours per semester
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| prerequisite |
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| Knowledge |
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| description of atom structure and types of bonds between atoms in a solid |
| characterization of individual types of radiation used in various techniques of solids investigation |
| characterization of basic types of force interactions |
| fundamentals of Fourier transform |
| Skills |
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| using vector algebra tools |
| using differential and integral calculus |
| Competences |
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| N/A |
| learning outcomes |
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| Knowledge |
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| description of materials analysis techniques including spectroscopic, thermal and diffraction analysis, microscopy, tomography and microanalytical techniques |
| description of physical principles, possibilities and limitations of the above techniques |
| recognition of each technique in the form of its results (diagram, diffractogram, image) and know how to interpret them |
| Skills |
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| application of X-ray spectral and diffraction analysis for determination of elemental composition, phase composition and real structure of substances |
| design of a suitable experimental analysis technique for the current problem concerning the structure of substances |
| competent assessment of the way of evaluating the measured data and optimizing the interpretation of the results |
| application of studied concepts in planning and conducting laboratory experiments |
| Competences |
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| N/A |
| teaching methods |
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| Knowledge |
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| Lecture |
| Practicum |
| Skills |
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| Lecture |
| Practicum |
| Competences |
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| Lecture |
| Practicum |
| assessment methods |
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| Knowledge |
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| Combined exam |
| Skills |
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| Combined exam |
| Competences |
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| Combined exam |
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Recommended literature
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Bhushan, Bharat. Springer handbook of nanotechnology : with 972 figures and 71 tables. Berlin : Springer, 2004. ISBN 3-540-01218-4.
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Bubert, H.; Jenett, H. Surface and thin film analysis : principles, instrumentation, applications. Weinheim : WILEY-VCH, 2002. ISBN 3-527-30458-4.
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Czichos H. Springer Handbook of Materials Measurement Methods.. Leipzig, 2006. ISBN 978-3-540-20785-6.
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Eckertová, L. (ed.). Diagnostics and Applications of Thin Films. Institute of Physics, Bristol, 1992.
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Gauglitz G. Handbook of Spectroscopy. Weinheim : WILEY-VCH, 2003. ISBN 3-527-29782-0.
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Haviar, S. Moodle kurz k předmětu EMSA.
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