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Course info
KET / DME
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Course description
Department/Unit / Abbreviation
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KET
/
DME
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Academic Year
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2023/2024
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Academic Year
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2023/2024
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Title
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Diagnostic methods in el. engineering
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Form of course completion
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Pre-Exam Credit
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Form of course completion
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Pre-Exam Credit
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Long Title
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Diagnostic methods in electrical engineering
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Accredited / Credits
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Yes,
3
Cred.
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Type of completion
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Combined
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Type of completion
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Combined
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Time requirements
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Lecture
1
[Hours/Week]
Tutorial
2
[Hours/Week]
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Course credit prior to examination
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No
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Course credit prior to examination
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No
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Automatic acceptance of credit before examination
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Yes in the case of a previous evaluation 4 nebo nic.
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Included in study average
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NO
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Language of instruction
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Czech, English
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Occ/max
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Automatic acceptance of credit before examination
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Yes in the case of a previous evaluation 4 nebo nic.
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Summer semester
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0 / -
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0 / -
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0 / -
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Included in study average
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NO
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Winter semester
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15 / -
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0 / -
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0 / -
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Repeated registration
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NO
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Repeated registration
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NO
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Timetable
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Yes
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Semester taught
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Winter semester
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Semester taught
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Winter semester
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Minimum (B + C) students
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10
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Optional course |
Yes
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Optional course
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Yes
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Language of instruction
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Czech, English
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Internship duration
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0
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No. of hours of on-premise lessons |
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Evaluation scale |
S|N |
Periodicity |
každý rok
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Periodicita upřesnění |
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Fundamental theoretical course |
No
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Fundamental course |
Yes
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Fundamental theoretical course |
No
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Evaluation scale |
S|N |
Substituted course
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None
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Preclusive courses
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N/A
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Prerequisite courses
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N/A
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Informally recommended courses
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N/A
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Courses depending on this Course
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KET/SNTDE
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Histogram of students' grades over the years:
Graphic PNG
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XLS
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Course objectives:
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The aim of the course is to introduce methods used for diagnostics of materials, substrates, electronic components and assemblies to students. The course is mainly focused on methods of optical, fluorescence and confocal microscopy, including methods used to increase contrast. The advanced methods of electron microscopy, scanning microscopy, ultrasound microscopy and X-ray microscopy including computed tomography will be also presented to students. Students will be introduced in the field of spectroscopy and X-ray fluorescence, enabling determination of elemental composition of materials. They will also be acquainted with the methods for the preparation of the materialography cross-sections. Students will learn and practically try procedures for the diagnostic of typical defects of electronic devices, including evaluation of defects of electronic elements and assemblies according to the IPC standard.
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Requirements on student
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- Active participation in a laboratory exercise
- Preparation of reports from laboratory work
- Knowledge of the course matter
- Test with oral verification of knowledge
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Content
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1. Introduction to the subject, basic terms of microscopy, the accuracy of measurement in microscopy, evaluation of typical defects of electronic elements and assemblies according to the IPC standard.
2. Optical, fluorescence and confocal microscopy, contrast methods, AOI, image data analysis, Endoscopy
3. Transmission and scanning electron microscopy, spectroscopy
4. Metallography and materialography, techniques for defects investigation
5. X-ray imaging and computed tomography
6. Scanning Probe Microscopy, Scanning Acoustic Microscopy, Thermography
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Activities
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Fields of study
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Studentům je k dispozici kurz v Google Classroom se všemi materiály pro přednášky a cvičení, systémem odevzdávání reportů z měření a zpracování závěrečného testu.
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Guarantors and lecturers
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Literature
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Time requirements
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All forms of study
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Activities
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Time requirements for activity [h]
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Contact hours
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39
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Preparation for laboratory testing; outcome analysis (1-8)
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8
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Preparation for comprehensive test (10-40)
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30
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Total
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77
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Prerequisites
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Knowledge - students are expected to possess the following knowledge before the course commences to finish it successfully: |
understand written English |
Competences - students are expected to possess the following competences before the course commences to finish it successfully: |
N/A |
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Learning outcomes
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Knowledge - knowledge resulting from the course: |
Explain the basic concepts of optical microscopy |
Describe the differences among the individual types of microscopes the imaging techniques |
To clarify the principles of contrast methods, confocal and fluorescence microscopy |
To clarify the principles of electron microscopy and scanning probe microscopy |
To clarify the principles of 2D and 3D X-ray analysis |
Describe the methods and procedures used to determine the elemental composition of the samples |
Describe the methods and procedures used for the preparation of metallographic cross-sections |
Skills - skills resulting from the course: |
Assess the suitability of individual diagnostic and microscopic methods according to the sample under examination |
Perform microscopic inspection of samples and find defects |
Evaluate the defects found on samples according to IPC standards and make conclusions |
Create a report from an optical inspection |
Apply the knowledge gained and clarify it to the professional public |
Competences - competences resulting from the course: |
N/A |
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Assessment methods
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Knowledge - knowledge achieved by taking this course are verified by the following means: |
Test |
Test with oral verification of knowledge |
Skills - skills achieved by taking this course are verified by the following means: |
Skills demonstration during practicum |
Individual presentation at a seminar |
Competences - competence achieved by taking this course are verified by the following means: |
Skills demonstration during practicum |
Individual presentation at a seminar |
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Teaching methods
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Knowledge - the following training methods are used to achieve the required knowledge: |
Lecture |
Skills - the following training methods are used to achieve the required skills: |
Laboratory work |
Multimedia supported teaching |
Field trip |
Individual study |
Competences - the following training methods are used to achieve the required competences: |
Lecture |
Individual study |
Laboratory work |
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